ODIM: Outlier Detection via Likelihood of Under-Fitted Generative Models

Read original: arXiv:2301.04257 - Published 7/17/2024 by Dongha Kim, Jaesung Hwang, Jongjin Lee, Kunwoong Kim, Yongdai Kim
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Overview

  • The paper addresses the unsupervised outlier detection (UOD) problem, which involves identifying inliers (normal data points) from a dataset that contains both inliers and outliers (anomalies) without any labeled information.
  • The authors claim that the likelihood from a carefully under-fitted deep generative model (DGM) can be a powerful signal for identifying inliers in UOD tasks.
  • They introduce the "inlier-memorization (IM) effect," which observes that DGMs initially memorize inliers before outliers during training.
  • The authors develop a new method called "outlier detection via the IM effect (ODIM)" that leverages this effect to efficiently filter out outliers, regardless of the data type.

Plain English Explanation

The paper discusses a problem called unsupervised outlier detection (UOD), where the goal is to identify normal data points (inliers) from a dataset that contains both normal data and abnormal data (outliers), without any labeled information about which is which. The authors claim that the likelihood, or probability, assigned by a carefully trained deep generative model (a type of AI model that can generate new data) can be a powerful way to distinguish inliers from outliers.

The key insight the authors have is the "inlier-memorization (IM) effect" - they find that when training these deep generative models on a dataset with both inliers and outliers, the models initially learn to "memorize" the inlier data before the outlier data. Based on this observation, the authors develop a new method called "outlier detection via the IM effect (ODIM)" that can efficiently filter out outliers from the dataset, regardless of whether the data is in the form of tables, images, or text.

The main advantage of the ODIM method is that it is computationally efficient, requiring only a few training updates to achieve good outlier detection performance, which is much faster than other deep learning-based outlier detection algorithms. The authors validate the effectiveness of their approach through extensive experiments on close to 60 different datasets.

Technical Explanation

The paper explores the unsupervised outlier detection (UOD) problem, where the goal is to identify inliers (normal data points) from a dataset that contains both inliers and outliers (anomalies), without any labeled information about which data points are which.

The authors observe that using fully-trained likelihood-based deep generative models (DGMs) often results in poor performance in distinguishing inliers from outliers. However, they claim that the likelihood itself can serve as powerful evidence for identifying inliers in UOD tasks, provided that the DGMs are carefully under-fitted.

The key insight is the "inlier-memorization (IM) effect" - the authors find that when training a DGM on a dataset with both inliers and outliers, the model initially memorizes the inliers before the outliers. Based on this, the authors develop a new method called "outlier detection via the IM effect (ODIM)" that leverages this effect to efficiently filter out outliers.

The ODIM method requires only a few training updates, making it computationally efficient - at least tens of times faster than other deep-learning-based outlier detection algorithms. The authors demonstrate the ODIM's effectiveness at filtering out outliers across a wide range of data types, including tabular, image, and text data.

To validate their claims, the authors provide extensive empirical analyses on close to 60 datasets. The results show that the ODIM outperforms other state-of-the-art outlier detection methods in terms of both effectiveness and efficiency.

Critical Analysis

The paper presents a novel and promising approach to the unsupervised outlier detection problem. The key insight about the "inlier-memorization effect" and the resulting ODIM method appear to be effective and computationally efficient compared to other deep learning-based outlier detection techniques.

However, the paper does not delve deeply into the limitations or potential issues with the proposed approach. For example, it would be helpful to understand how the ODIM method performs on datasets with different levels of outlier contamination or with outliers that are more subtle and difficult to distinguish from inliers.

Additionally, the authors could have provided more discussion on the theoretical underpinnings of the IM effect and how it relates to the properties of deep generative models. A deeper analysis of this phenomenon could lead to further insights and potential improvements to the ODIM method.

Overall, the paper presents a valuable contribution to the field of unsupervised outlier detection, but there are opportunities for further research to address the method's limitations and expand our understanding of the underlying principles.

Conclusion

This paper introduces a novel approach to the unsupervised outlier detection (UOD) problem, which is an important task in many real-world applications. The key innovation is the discovery of the "inlier-memorization (IM) effect" - the observation that deep generative models initially memorize inliers before outliers during training.

By leveraging this effect, the authors develop a new method called "outlier detection via the IM effect (ODIM)" that can efficiently filter out outliers from datasets, regardless of the data type. The ODIM method is shown to outperform other state-of-the-art deep learning-based outlier detection approaches in terms of both effectiveness and computational efficiency.

The implications of this research are significant, as efficient and robust outlier detection can have a wide range of applications, from anomaly detection in sensor networks to fraud identification in financial transactions. The insights gained from this work could also lead to further advancements in unsupervised out-of-distribution detection and outlier-aware metric learning, paving the way for more reliable and trustworthy AI systems.



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ODIM: Outlier Detection via Likelihood of Under-Fitted Generative Models

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