YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images
0
Sign in to get full access
Overview
- This paper presents a novel multi-scale deep learning-based method called YOLO-pdd for detecting defects on printed circuit boards (PCBs).
- The method leverages deep representations and sequential images to accurately locate and classify various types of PCB defects at different scales.
- YOLO-pdd outperforms existing state-of-the-art PCB defect detection techniques in terms of accuracy and inference speed.
Plain English Explanation
Printed circuit boards (PCBs) are essential components in electronic devices. However, identifying defects on PCBs during the manufacturing process can be challenging. This paper introduces a new deep learning-based approach called YOLO-pdd that can accurately detect and classify different types of PCB defects at various scales.
The key innovation of YOLO-pdd is its ability to leverage deep representations and analyze sequential images of the PCB surface. By considering multiple scales and using deep learning models, YOLO-pdd can identify a wide range of defects, such as holes, cracks, and missing components, more effectively than previous methods.
The researchers tested YOLO-pdd on several PCB defect datasets and found that it outperforms existing state-of-the-art techniques in terms of both detection accuracy and inference speed. This means YOLO-pdd can quickly and reliably identify defects on PCBs, which is crucial for maintaining product quality and reducing manufacturing costs.
Technical Explanation
The authors propose a multi-scale PCB defect detection method called YOLO-pdd that utilizes deep representations and sequential image analysis. The method is based on the popular YOLO (You Only Look Once) object detection architecture, which allows for real-time defect identification.
YOLO-pdd works by first extracting deep features from multiple layers of a convolutional neural network (CNN). These multi-scale features are then used to predict bounding boxes and class probabilities for potential defects. The model also takes advantage of sequential image data, processing frames of the PCB surface to improve defect detection accuracy.
The authors conducted extensive experiments on several PCB defect datasets, including the PCB-DDB and ECPCD-1K benchmarks. They compared YOLO-pdd's performance to other state-of-the-art methods, such as Faster R-CNN and YOLO-v5. The results show that YOLO-pdd achieves superior defect detection accuracy while maintaining faster inference speeds.
Critical Analysis
The YOLO-pdd method presented in this paper demonstrates the potential of deep learning and multi-scale analysis for improving PCB defect detection. By leveraging sequential image data and combining features from multiple CNN layers, the authors have developed a robust and efficient solution that outperforms existing approaches.
However, the paper does not provide a detailed analysis of the method's limitations or potential weaknesses. For example, the authors do not discuss how YOLO-pdd might perform on more complex or obscured PCB defects, or how the method's accuracy and inference speed might be affected by variations in PCB sizes, materials, or manufacturing processes.
Additionally, the paper could benefit from a more thorough exploration of the broader implications of this research. While the authors highlight the practical advantages of YOLO-pdd for PCB quality control, they could further discuss how this work might contribute to advancements in other industrial inspection and quality assurance applications.
Conclusion
The YOLO-pdd method presented in this paper represents a significant advancement in the field of PCB defect detection. By combining multi-scale deep representations and sequential image analysis, the authors have developed a highly accurate and efficient solution that outperforms existing state-of-the-art techniques.
The successful implementation of YOLO-pdd could have far-reaching implications for the electronics manufacturing industry, enabling faster and more reliable quality control processes. This work also highlights the potential of deep learning and computer vision to revolutionize various industrial inspection tasks, paving the way for further innovations in this space.
This summary was produced with help from an AI and may contain inaccuracies - check out the links to read the original source documents!
Related Papers
0
YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images
Bowen Liu, Dongjie Chen, Xiao Qi
With the rapid growth of the PCB manufacturing industry, there is an increasing demand for computer vision inspection to detect defects during production. Improving the accuracy and generalization of PCB defect detection models remains a significant challenge. This paper proposes a high-precision, robust, and real-time end-to-end method for PCB defect detection based on deep Convolutional Neural Networks (CNN). Traditional methods often suffer from low accuracy and limited applicability. We propose a novel approach combining YOLOv5 and multiscale modules for hierarchical residual-like connections. In PCB defect detection, noise can confuse the background and small targets. The YOLOv5 model provides a strong foundation with its real-time processing and accurate object detection capabilities. The multi-scale module extends traditional approaches by incorporating hierarchical residual-like connections within a single block, enabling multiscale feature extraction. This plug-and-play module significantly enhances performance by extracting features at multiple scales and levels, which are useful for identifying defects of varying sizes and complexities. Our multi-scale architecture integrates feature extraction, defect localization, and classification into a unified network. Experiments on a large-scale PCB dataset demonstrate significant improvements in precision, recall, and F1-score compared to existing methods. This work advances computer vision inspection for PCB defect detection, providing a reliable solution for high-precision, robust, real-time, and domain-adaptive defect detection in the PCB manufacturing industry.
Read more7/23/2024
0
New!Enhancing Printed Circuit Board Defect Detection through Ensemble Learning
Ka Nam Canaan Law, Mingshuo Yu, Lianglei Zhang, Yiyi Zhang, Peng Xu, Jerry Gao, Jun Liu
The quality control of printed circuit boards (PCBs) is paramount in advancing electronic device technology. While numerous machine learning methodologies have been utilized to augment defect detection efficiency and accuracy, previous studies have predominantly focused on optimizing individual models for specific defect types, often overlooking the potential synergies between different approaches. This paper introduces a comprehensive inspection framework leveraging an ensemble learning strategy to address this gap. Initially, we utilize four distinct PCB defect detection models utilizing state-of-the-art methods: EfficientDet, MobileNet SSDv2, Faster RCNN, and YOLOv5. Each method is capable of identifying PCB defects independently. Subsequently, we integrate these models into an ensemble learning framework to enhance detection performance. A comparative analysis reveals that our ensemble learning framework significantly outperforms individual methods, achieving a 95% accuracy in detecting diverse PCB defects. These findings underscore the efficacy of our proposed ensemble learning framework in enhancing PCB quality control processes.
Read more9/17/2024
🔎
0
Faster Metallic Surface Defect Detection Using Deep Learning with Channel Shuffling
Siddiqui Muhammad Yasir, Hyunsik Ahn
Deep learning has been constantly improving in recent years and a significant number of researchers have devoted themselves to the research of defect detection algorithms. Detection and recognition of small and complex targets is still a problem that needs to be solved. The authors of this research would like to present an improved defect detection model for detecting small and complex defect targets in steel surfaces. During steel strip production mechanical forces and environmental factors cause surface defects of the steel strip. Therefore the detection of such defects is key to the production of high-quality products. Moreover surface defects of the steel strip cause great economic losses to the high-tech industry. So far few studies have explored methods of identifying the defects and most of the currently available algorithms are not sufficiently effective. Therefore this study presents an improved real-time metallic surface defect detection model based on You Only Look Once (YOLOv5) specially designed for small networks. For the smaller features of the target the conventional part is replaced with a depth-wise convolution and channel shuffle mechanism. Then assigning weights to Feature Pyramid Networks (FPN) output features and fusing them increases feature propagation and the networks characterization ability. The experimental results reveal that the improved proposed model outperforms other comparable models in terms of accuracy and detection time. The precision of the proposed model achieved by @mAP is 77.5% on the Northeastern University Dataset NEU-DET and 70.18% on the GC10-DET datasets
Read more6/24/2024
0
Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS
Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Victor Blanco, Sandip Halder, Philippe Leray
Due to potential pitch reduction, the semiconductor industry is adopting High-NA EUVL technology. However, its low depth of focus presents challenges for High Volume Manufacturing. To address this, suppliers are exploring thinner photoresists and new underlayers/hardmasks. These may suffer from poor SNR, complicating defect detection. Vision-based ML algorithms offer a promising solution for semiconductor defect inspection. However, developing a robust ML model across various image resolutions without explicit training remains a challenge for nano-scale defect inspection. This research's goal is to propose a scale-invariant ADCD framework capable to upscale images, addressing this issue. We propose an improvised ADCD framework as SEMI-SuperYOLO-NAS, which builds upon the baseline YOLO-NAS architecture. This framework integrates a SR assisted branch to aid in learning HR features by the defect detection backbone, particularly for detecting nano-scale defect instances from LR images. Additionally, the SR-assisted branch can recursively generate upscaled images from their corresponding downscaled counterparts, enabling defect detection inference across various image resolutions without requiring explicit training. Moreover, we investigate improved data augmentation strategy aimed at generating diverse and realistic training datasets to enhance model performance. We have evaluated our proposed approach using two original FAB datasets obtained from two distinct processes and captured using two different imaging tools. Finally, we demonstrate zero-shot inference for our model on a new, originating from a process condition distinct from the training dataset and possessing different Pitch characteristics. Experimental validation demonstrates that our proposed ADCD framework aids in increasing the throughput of imaging tools for defect inspection by reducing the required image pixel resolutions.
Read more4/10/2024