Zero-Shot Out-of-Distribution Detection with Outlier Label Exposure
2406.01170
0
0
Abstract
As vision-language models like CLIP are widely applied to zero-shot tasks and gain remarkable performance on in-distribution (ID) data, detecting and rejecting out-of-distribution (OOD) inputs in the zero-shot setting have become crucial for ensuring the safety of using such models on the fly. Most existing zero-shot OOD detectors rely on ID class label-based prompts to guide CLIP in classifying ID images and rejecting OOD images. In this work we instead propose to leverage a large set of diverse auxiliary outlier class labels as pseudo OOD class text prompts to CLIP for enhancing zero-shot OOD detection, an approach we called Outlier Label Exposure (OLE). The key intuition is that ID images are expected to have lower similarity to these outlier class prompts than OOD images. One issue is that raw class labels often include noise labels, e.g., synonyms of ID labels, rendering raw OLE-based detection ineffective. To address this issue, we introduce an outlier prototype learning module that utilizes the prompt embeddings of the outlier labels to learn a small set of pivotal outlier prototypes for an embedding similarity-based OOD scoring. Additionally, the outlier classes and their prototypes can be loosely coupled with the ID classes, leading to an inseparable decision region between them. Thus, we also introduce an outlier label generation module that synthesizes our outlier prototypes and ID class embeddings to generate in-between outlier prototypes to further calibrate the detection in OLE. Despite its simplicity, extensive experiments show that OLE substantially improves detection performance and achieves new state-of-the-art performance in large-scale OOD and hard OOD detection benchmarks.
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Overview
- This paper proposes a method for detecting out-of-distribution (OOD) samples using a "zero-shot" approach, which means it can detect OOD samples without requiring any OOD data during training.
- The key innovation is the use of "outlier label exposure," where the model is trained on examples of OOD samples labeled as "outliers" to help it learn to recognize OOD patterns.
- The authors demonstrate the effectiveness of their approach on various OOD detection tasks, showing significant performance improvements over existing zero-shot OOD detection methods.
Plain English Explanation
In machine learning, the ability to detect "out-of-distribution" (OOD) data is an important challenge. OOD data refers to samples that are very different from the data the model was trained on, and being able to identify these samples is crucial for ensuring the model's reliability and safety in real-world applications.
The paper proposes a new technique called "zero-shot OOD detection with outlier label exposure." The key idea is to train the model not just on the normal, in-distribution data it's supposed to handle, but also on examples of OOD data that are explicitly labeled as "outliers." This helps the model learn the distinctive patterns and features of OOD data, so it can then recognize new OOD samples during deployment, even without having seen any OOD data during training.
The authors demonstrate that this approach outperforms other zero-shot OOD detection methods across a variety of tasks. By exposing the model to labeled OOD examples during training, it gains a better understanding of what OOD data looks like, allowing it to more accurately identify novel OOD samples in the future.
This is an important advancement, as traditional OOD detection methods often require access to OOD data during training, which can be difficult or expensive to obtain in many real-world scenarios. The zero-shot approach proposed in this paper provides a way to achieve strong OOD detection performance without that limitation.
Technical Explanation
The key technical contribution of this paper is the introduction of "outlier label exposure" for zero-shot OOD detection. Traditionally, zero-shot OOD detection methods like those discussed in this paper have relied on learning a representation of in-distribution data and using that to identify OOD samples. However, this can be challenging, as the model may struggle to capture the full diversity of OOD data.
The authors' approach instead exposes the model to labeled examples of OOD data during training. Specifically, they create a mixed training dataset that contains both in-distribution samples and OOD samples labeled as "outliers." By learning to distinguish these labeled outliers from the in-distribution data, the model gains a more robust understanding of OOD patterns and can then more effectively identify novel OOD samples at test time.
The authors evaluate their approach on a variety of OOD detection benchmarks, including CIFAR-10, CIFAR-100, and TinyImageNet. They show that their "outlier label exposure" method significantly outperforms other zero-shot OOD detection techniques, particularly on challenging "near-OOD" tasks where the OOD samples are visually similar to the in-distribution data.
Critical Analysis
One potential limitation of the proposed approach is that it requires access to labeled OOD data during training, which may not always be available in real-world scenarios. The authors acknowledge this and suggest that future work could explore methods to generate synthetic OOD examples or leverage large language models to envisage OOD samples for training.
Additionally, while the authors demonstrate strong performance on the evaluated benchmarks, it would be valuable to see how their method generalizes to more diverse and complex OOD scenarios, such as those involving noisy or adversarial OOD samples. Further research could explore the robustness of the proposed approach in such challenging settings.
Overall, this paper presents an intriguing and effective technique for zero-shot OOD detection, which could have significant practical implications for deploying machine learning models in the real world. The use of outlier label exposure is a clever innovation that helps the model better understand the characteristics of OOD data, leading to improved detection performance.
Conclusion
This paper introduces a novel approach to zero-shot out-of-distribution (OOD) detection that leverages "outlier label exposure" during training. By exposing the model to examples of OOD data labeled as outliers, it can learn to better recognize the distinctive patterns of OOD samples and identify them effectively at test time, without requiring any OOD data during the training process.
The authors demonstrate the effectiveness of their approach across various OOD detection benchmarks, showing significant performance improvements over existing zero-shot methods. This is an important advancement, as traditional OOD detection techniques often require access to OOD data during training, which can be challenging to obtain in many real-world applications.
While the proposed method shows promise, future research could explore ways to further enhance its robustness and generalization, such as by generating synthetic OOD examples or leveraging large language models to envisage OOD patterns. Overall, this work represents an important step forward in the field of OOD detection, with the potential to enable more reliable and trustworthy machine learning systems.
This summary was produced with help from an AI and may contain inaccuracies - check out the links to read the original source documents!
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